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Temperature Dependent Electrical Study of Ge17Se74Sb9 Thin Film |
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PP: 21-24 |
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Author(s) |
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Pankaj Sharma,
Vineet Sharma,
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Abstract |
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| Bulk sample of Ge17Se74Sb9 alloy was prepared using melt-quench technique. Thin film of the alloy was deposited using
thermal evaporation. Thin film was characterized by x-ray diffraction and current-voltage measurements were obtained at different
temperatures ranging from 298K to 348K at a step of 5K using an electrometer and were found to be ohmic in nature. The temperature
and voltage dependence of resistivity of thin film has been studied. |
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