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Effect of γ-irradiation on Structural and Optical Ellipsometry Parameters of ZnO Nanocrystalline Thin Films |
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PP: 129-141 |
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Author(s) |
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E. R. Shaaban,
A. M. A. Mostafa,
H. Shokry Hassan,
M. S. Abd El-Sadek,
Gehan Y. Mohamed,
I. Sharaf,
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Abstract |
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| In the present work, The ZnO powder was prepared by sol-gel method. The microstructure and surface morphology of ZnO powder were characterized by thermo gravimetric (TG) analysis, differential scanning calorimeter (DSC) and X-ray diffraction (XRD). Thin film of ZnO was prepared using thermal evaporation technique. The effect of γ -irradiation with different doses (100, 300 and 500 kGy) on the structural and optical properties of ZnO thin film were studied. The microstructure parameters, e.g., crystallite size and microstrain for three different doses were calculated. The optical constants (n, k) for three different doses of γ -irradiation of ZnO thin film were obtained by fitting the ellipsometric parameters (ψ and Δ) data using three layer model systems in the wavelength range 300–1100 nm. It is found that the refractive index, n increases with increasing the doses of γ -irradiation. But the obtained optical energy gap of nanocrystalline ZnO films was found to decrease with increasing the doses of the γ –radiation. |
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