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Structural and optical properties of ZnS thin films |
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PP: 17-24 |
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Author(s) |
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E. Márquez,
E. R. Shaaban,
A. M. Abousehly,
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Abstract |
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| Various thicknesses of cadmium sulfide ZnS thin films were evaporated onto glass substrates using the thermal evaporation
technique. X-ray diffraction analysis indicates that both the film and powder have cubic zincblende structure. The microstructure
parameters, crystallite size and microstrain were calculated. It was observed that the crystallite size increases but the microstrain
decreases with increase the film thickness. The band gaps of the ZnS thin films were found to be direct allowed transitions and increase
from 3.33 to 3.46 eV with increasing the film thickness. The refractive indices have been evaluated in transparent region using the
envelope method in the transparent region. The refractive index can be interapolated and extrapolated in terms of Cauchy dispersion
relationship over the whole spectra range, which extended from 300 to 2500 nm. It was observed that the refractive index, n increase
on increasing the film thickness. |
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