|
|
 |
| |
|
|
|
Structural and Optical Properties of Sulphurised Ag2S Thin Films |
|
|
|
PP: 9-12 |
|
|
|
Author(s) |
|
|
|
P. E. Agbo,
P. A. Nwofe,
|
|
|
|
Abstract |
|
|
| Thin films of silver (Ag) were thermally evaporated onto glass substrates. The films were then sulphurised using a simple chemical sulphurisation method with sulphurisation temperatures in the range 300oC to 350oC. The sulphurised films were then annealed using annealing temperatures in the range 250 oC to 350 oC. X-ray Diffractometer (XRD) and optical data are given for the as-sulphurised and the annealed layers. The structural and optical properties of the as-sulphurised layers show a poor crystallinity and weak transmission. However, annealing improved the crystallinity of the layers such that sharp X-ray diffraction peaks belonging to the acanthite phase was observed from X-ray diffractometry analysis. The annealed films had direct energy bandgap with energy bandgap in the range 2.10 eV to 2.20 eV |
|
|
|
|
|
|
|
