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Optical and Structural Studies of Silver Oxide Thin Films |
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PP: 57-62 |
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doi:10.18576/ijtfst/140109
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Author(s) |
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Karamvir Tanwar,
David Joseph,
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Abstract |
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| In this study, silver oxide thin films were deposited at room temperature using thermal evaporation on glass substrates. The films structural, surface morphological, and linear optical properties were analyzed. X-ray diffraction (XRD) analysis indicated that the films exhibit a cubic structure. Field emission scanning electron microscopy (FE-SEM) revealed an average grains size between 38 nm and 43 nm. Energy dispersive X-ray spectroscopy (EDX) confirmed the presence of silver (Ag) and oxygen (O) in the samples. UV-Vis, FTIR, and laser Raman spectroscopy were also conducted on thin films.
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