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Structural, Morphological, Optical and FTIR Analysis of Spray Deposited (040) Oriented Tin Sulphide Thin Film for Photovoltaic Applications |
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PP: 189-193 |
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doi:10.18576/ijtfst/130303
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Author(s) |
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G. Anbazhagan,
J. Vijayarajasekaran,
L. Amalraj,
K. Vijayakumar,
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Abstract |
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Thin film of tin sulphide (SnS) has been prepared at the substrate temperature 300°C by chemical spray pyrolysis technique on glass substrate. The precursor solutions are tin chloride dehydrate (SnCl2·2H2O) and thiourea in de- ionized water and Isopropyl alcohol in molarity ratio 1:1. The structural, morphological and optical properties were studied using X-ray diffraction (XRD), scanning electron microscope (SEM), UV–Vis spectrophotometer and FTIR. The structure of the film was found to be orthorhombic with preferential orientation along (040) plane. X-ray line profile analysis was used to evaluate the micro structural parameters such as crystallite size, micro strain, dislocation density. The average crystallite size value determined as 27 nm. Thickness of film was found using surface roughness profilometer. Morphological results of the SnS thin film was spherical shaped particles. The compositional analysis of tin sulfide thin film was determined using EDAX spectrum. The optical studies revealed that the direct optical band gap value as 1.53 eV and transmittance spectrum recorded in the wavelength range 400 nm-1100 nm. The bond structure of SnS thin film was determined using FTIR studies in the range of 500 – 3500cm-1.
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