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Calculation of Optical Constants of As40S60-xSex Thick Films with High Accuracy using Wedge Shape Optical Model |
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PP: 157- 169 |
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doi:10.18576/ijtfst/110202
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Author(s) |
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A. Almohammedi,
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Abstract |
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| This work has been focused primarily on the extraction of thicknesses, optical, and AC electrical parameters for as-prepared As40S60-xSex thin films, with (x=0, 20, 40, and 60 at. %). The thickness of such films has been calculated by the wedge method depending on the transmission spectra of their shrinkage in the range of 400 to 2500 nm. Swanepoels wedge relationships have been solved using the Mathcad 2000 program by minerr function to extract the film’s thickness. Depending on the obtained thickness of studied the thin films, the main optical parameters have been determined. The structural aspects of the studied thin films have also been studied using XRD and SEM techniques.
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