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Study on Quality of Pair Distribution Function for Direct Space Approach of Structure Investigation |
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PP: 143-152 |
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doi:10.18576/ijtfst/110118
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Author(s) |
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A. F. Mabied,
A. R. Shalaby,
A. A. Ramadan,
M. R. Abaid,
H. M. Hashem,
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Abstract |
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| Study of the structure characteristics of solid materials is a key for development of technological applications. Potential of direct space approach for structure determination and refinement using powder X-ray diffraction data depend on the quality of pair distribution function (PDF) plot. So, the effect of data collection conditions and diffractogram characteristics on the quality of PDF plot has been investigated in detail. In addition, errors and possible tolerance have been estimated. Some parameters affect only either the X-ray diffractogram or PDF plots and others affect both. Considering the errors and tolerance, direct space approach can be confidently used for structure refinement, where the error did not exceed 10.0 % for inter-atomic radial distance longer than » 2.0 Å and 5.0 % for longer than » 4.0 Å, which is accepted for structure refinement. As tolerance is considered, every time the value of the lattice parameter is changed to smaller or larger than the correct value (+ 8.0 %), it comes back to the initial correct one. Although, advanced synchrotron radiation shows better data, conventional source can be used successfully for structure investigation applying direct space approach.
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