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Molarity Dependent on CVD Misted ZnS Buffer Layer Performance |
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PP: 239-248 |
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doi:10.18576/ijtfst/100314
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Author(s) |
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Fadoua Mansouri,
Yassine Khaaissa,
Abdelali Talbi,
Khalid Nouneh,
Outman El Khouja,
Hassan Ahmoum,
Aurelian Catalin Galca,
Guojian Li,
Qiang wang,
Omar Bajjou,
Mustapha Mabrouki,
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Abstract |
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| This paper manifests the synthesis and characterization of zinc sulfur (ZnS) thin films combined with numerical simulation (SCAPS-1D). The synthesis has been done by mixing and depositing Zn and S precursors on a preheated glass substrate (450 °C) with different molar concentrations. X-ray diffraction (XRD) shows the formation of polycrystalline ZnS with a mixed hexagonal/cubic structure. Raman spectroscopy analysis validates the films purity with a predominant peak at 348 cm-1 corresponding to the cubic structure. Composition elements and atomic ratio have been confirmed by the energy dispersive X-ray analysis (EDX). Scanning electronic microscopy (SEM) and atomic force microscopy (AFM) images show uniform and well-arranged spherical grains on the samples surface with a non-neglected roughness variation. The optical results show high transparency in the visual field of light (≃80%) and a sharp absorption edge in the UV domain. The optical band gap has been considerably decreased with increasing the concentrations reflecting its high dependency on the molarity rate. Numerical modeling results using SCAPS-1D software show that samples corresponding to 0.06 and 0.08 molarity present better performance with an efficiency of 8.94% and 8.9%, respectively.
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