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Effect of W Doping on NiO Thin Films and its Optical, Morphological and Diode Characteristics |
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PP: 131-138 |
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doi:10.18576/ijtfst/080305
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Author(s) |
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Saju Joseph,
O. N. Balasundaram,
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Abstract |
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| In this work, we demonstrate the preparation of simple and inexpensive spray route for the preparation of pure and W doped NiO thin films on the quartz glass plates. The microstructure and morphological properties were investigated using an X-ray diffraction and Scanning electron microscopic (SEM) studies. SEM images notify the presence of hollow sphere and the energy dispersive spectrum confirms the existence of both Ni and W in the prepared films. Electrical properties were investigated by two probe conductivity studies. In addition to these studies (n-Si/NiO/Au and n- Si/W:NiO/Au) diodes were fabricated and their chattels were deliberated.
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