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Generalized Inverted Exponential Distribution on Optimum SS-PALT: Some Bayes Estimation |
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PP: 457-467 |
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doi:10.18576/jsap/070306
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Author(s) |
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Gyan Prakash,
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Abstract |
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| The present article, studied about the Bayes risks of the unknown parameters of the generalized Inverted Exponential
distribution. The Optimum Step-Stress Partially Accelerated Life Test (SS-PALT) has been used under the different censoring patterns.
A comparison between Bayes risks of two different asymmetric loss functions has presented. Numerical illustration has also been
carried out by the help of the real and simulated data set. |
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