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Studies on Information States Measurement for Modeling Design |
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PP: 627-632 |
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Author(s) |
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Yi Gan,
Junlei Wang,
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Abstract |
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Three kinds of information states in the product information transfer process were introduced, which come from Top Basic Skeleton to Sub-basic Skeleton or parts layer-by-layer. In the process, the product has three information states, and the structures of the process were serial and parallel. In terms of the structures of information transfer and variant designs, the information distances among the product information states were measured by calculating transition probability. This method provides the foundation of manufacturing informatics for design. |
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