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Models, Methods and Measurements of Thin Films Resistivities of Ni/Cu Bi layers and Ni/Pd/Cu Tri layers Films. |
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PP: 67-71 |
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doi:10.18576/ijtfst/070203
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Author(s) |
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M. K. Loudjani,
C. Sella,
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Abstract |
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| In this study we compared resistivity measurements I and film thicknesses obtained on bi layers Ni/Cu films and
tri layers Ni/Pd/Cu films with the values of resistivities and thicknesses calculated according to the model of Schumann and
Gardner applied to a multi-layera system. The experimental and calculated values agree within a few %. |
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