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A Control Chart for Time Truncated Life Tests Using Exponentiated Half Logistic Distribution |
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PP: 125-131 |
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doi:10.18576/amis/120111
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Author(s) |
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Gadde Srinivasa Rao,
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Abstract |
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| In this article, an exponentiated half logistic distribution considered to develop an attribute control chart for time truncated life tests with known or unknown shape parameter. The performance of the proposed chart is evaluated in terms of average run length (ARL) using the Monte Carlo simulation. The extensive tables are provided for the industrial use for various values of shape parameter, sample size, specified ARL and shift constants. The advantages of the proposed control chart are discussed over the existing truncated life test control charts. The performance of the proposed control chart is also studied using the simulated data sets for industrial purpose. |
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