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A Combination of μ-PIXE, XRF, SEM-EDS and XRD Techniques in the Analyses of Sn-Mine Tailings |
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PP: 95-102 |
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Author(s) |
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Felix S. Olise,
Oyediran K. Owoade,
Solomon A. Adekola,
Hezekiah B. Olaniyi,
Christopher B. Mtshali,
Wojciech J. Przybylowicz,
Carlos A. Pineda-Vargas,
Malik Maaza,
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Abstract |
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| A combination of microprobe proton induced x-ray emission (μ-PIXE), x-ray fluorescence (XRF), energy dispersive spectroscopy-scanning electron microscopy (SEM-EDS) and x-ray diffraction (XRD) techniques have been applied in the analyses of tailings of tin (Sn) mining activities in the Jos Plateau, Nigeria. This paper reviews the elemental composition and distribution maps across single mineral grains. The microscopic data obtained are discussed to understand the mineral phases; and the provenance of economically important recoverable metals, associated with the major indicator mineral element, contained in the investigated samples. Caution is required when using automated elemental analysis of the portable XRF instrument, of which user has no control. The obtained results must always be confirmed using another analytical method. |
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