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Reliability Estimation for Negative Binomial Distribution Under Type-II Censoring Scheme |
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PP: 89-98 |
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doi:10.18576/jsap/050108
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Author(s) |
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Jitendra Kumar,
Sanjeev K. Tomer,
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Abstract |
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The negative binomial distribution is a well recognized lifetime model. In this paper, we consider estimation of reliability
measures of this model using type-II censored data. We obtain maximum likelihood and Bayes estimates of parameter, reliability
function and hazard rate of this model. We also provide asymptotic, bootstrap and Bayesian credible intervals for the parameter.
Finally, we give numerical illustration based on simulation study. |
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